Transmission Electron Microscope(TEM) / Scanning Transmission Electron Microscope(STEM)
Cathodoluminescence STEM, CFEG Aberration Corrected TEM / STEM R005

Film Deposition
Physical Vapor Deposition (Sputtering, Arc/Themal Evaporation)

Optical Instrument
Vis-NIR Spectrometer, Spectro-microscope, Fluorescent Microscope, Temperature Variable Vacuum Spectrometer

Surface Characterization
Atomic Force Microscope (AFM), Portable Scanning Electron Microscope (SEM), Ellipsometer

Surface Modification
Plasma Cleaner, UV Ozone Cleaner, Wet Chemistry Facilities

We also use shared instrument : Atomic Force Microscope (AFM), Scanning Electron Miscroscope(SEM), Vibrating Sample Magnetometer(VSM) etc.

Simulation & Software Development
Electromagnetics (Optics) :
Finite Element Method (FEM), Multiple Multipole Program(MMP), Boundary Element Method (BEM), Finite Difference Time Domain (FDTD)
Ab-initio Calculation : Materials Studio (CASTEP)
Various Self-coded Softwares (Matlab, C++, VB, Mathematica, Python etc)

School of
Materials & Chem.Tech.
Sannomiya Lab.

226-8502 J2-49, 4259 Nagatsuta, Midoriku, Yokohama, Japan; | sannomiya.t.aa (at) m.titech.ac.jp

Copyright   T. Sannomiya and Tokyo Tech. All Rights Reserved.